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FLUORESCENT X-RAY ANALYSIS METHOD OF CARBONACEOUS MATERIAL, FLUORESCENCE X-RAY ANALYZER, ITS CONTROL METHOD, AND ITS PROGRAM

机译:碳纤维荧光X射线分析方法,荧光X射线分析仪,控制方法及其程序

摘要

PROBLEM TO BE SOLVED: To analyze quantitatively more quickly and easily an element included in a carbonaceous material by a fluorescence X-ray analysis.;SOLUTION: A fluorescence X-ray analyzer 20 determines a content of a contained element contained in the carbonaceous material by the second measuring method (for example, an ICP emission analysis method) which is different from a fluorescence X-ray analysis method, determines an intensity value of the contained element by a fluorescence X-ray measuring unit 30, stores correspondence relation information (calibration curve) between the acquired content and intensity value in an HDD 25, detects fluorescence X-ray intensity of an unknown sample, and determines the content of the contained element in the unknown sample based on the intensity value of the contained element and the correspondence relation information stored in the HDD 25. Though not having sensitivity to carbon, in the fluorescence X-ray analysis method, determination is possible by utilizing the second measuring method, and an element contained in the sample can be determined quickly and nondestructively.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:为了通过荧光X射线分析更快速,容易地定量分析含碳材料中所含的元素。解决方案:荧光X射线分析仪20通过以下方法确定含碳材料中所含元素的含量:与荧光X射线分析方法不同的第二测量方法(例如,ICP发射分析方法)通过荧光X射线测量单元30确定所含元素的强度值,并存储对应关系信息(校准HDD 25中获取的含量和强度值之间的曲线),检测未知样品的荧光X射线强度,并根据所含元素的强度值和对应关系确定未知样品中所含元素的含量信息存储在HDD 25中。尽管对碳不敏感,但在荧光X射线分析方法中,可以确定运用第二种测量方法,可以快速,无损地测定样品中所含的元素。版权所有:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP2009192360A

    专利类型

  • 公开/公告日2009-08-27

    原文格式PDF

  • 申请/专利权人 NGK INSULATORS LTD;

    申请/专利号JP20080033058

  • 发明设计人 OTSUKI SATOKO;WATANABE MITSUYOSHI;

    申请日2008-02-14

  • 分类号G01N23/223;G01N21/73;G01N21/31;

  • 国家 JP

  • 入库时间 2022-08-21 19:45:44

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