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METHOD FOR PRODUCING AN ELECTRONIC COMPONENT WITH DOUBLE QUANTUM DOTS

机译:用双量子点生产电子元件的方法

摘要

A process for fabricating an electronic component incorporating double quantum dots and split gates includes providing a substrate surmounted with a stack of a semiconductor layer and of a dielectric layer that is formed above the semiconductor layer. The process also includes forming a mask on the dielectric layer and etching the dielectric layer and the semiconductor layer with the pattern of the mask, so as to form a stack of a semiconductor nanowire and of a dielectric hard mask. Finally, the process includes depositing a gate material on all the wafer and carrying out a planarization, until the dielectric hard mask is reached, so as to form first and second gates that are electrically insulated from each other on either side of said nanowire.
机译:制造包含双量子点和分割栅极的电子元件的方法包括提供与半导体层的叠层和形成在半导体层上方的介电层的基板。 该过程还包括在介电层上形成掩模并用掩模的图案蚀刻介电层和半导体层,以形成半导体纳米线和介电硬掩模的叠。 最后,该方法包括在所有晶片上沉积栅极材料并进行平坦化,直到达到介电硬掩模,以形成在所述纳米线的任一侧彼此电绝缘的第一和第二栅极。

著录项

  • 公开/公告号EP3701567B1

    专利类型

  • 公开/公告日2021-11-03

    原文格式PDF

  • 申请/专利权人

    申请/专利号EP20180814987

  • 发明设计人 BARRAUD SYLVAIN;HUTIN LOUIS;VINET MAUD;

    申请日2018-10-17

  • 分类号H01L29/66;H01L29/423;H01L29/06;B82Y10;B82Y40;

  • 国家 EP

  • 入库时间 2024-06-14 22:19:29

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