首页> 外国专利> PHOSPHORUS-MODIFIED MFI-STRUCTURED MOLECULAR SIEVE, CATALYTIC CRACKING AUXILIARY AGENT AND CATALYTIC CRACKING CATALYST CONTAINING PHOSPHORUS-MODIFIED MFI-STRUCTURED MOLECULAR SIEVE, AND PREPARATION METHOD THEREFOR

PHOSPHORUS-MODIFIED MFI-STRUCTURED MOLECULAR SIEVE, CATALYTIC CRACKING AUXILIARY AGENT AND CATALYTIC CRACKING CATALYST CONTAINING PHOSPHORUS-MODIFIED MFI-STRUCTURED MOLECULAR SIEVE, AND PREPARATION METHOD THEREFOR

机译:磷改性的MFI结构分子筛,催化裂解助剂和含磷改性MFI结构分子筛的催化裂解催化剂,以及其制备方法

摘要

Provided is a phosphorus-modified MFI-structured molecular sieve. The value of K of the molecular sieve satisfies that 70%≤K≤90%, for example, 75%≤K≤90%, furthermore, for example, 78%≤K≤85%, wherein K=P1/P2×100%, P1 represents the mass content of phosphorus within an area of 100 square nanometers and a vertical depth of 0-2 nm of any crystal plane of molecular sieve crystal grains measured by an XPS method, and P2 represents the mass content of phosphorus within an area of 100 square nanometers and a thickness interval of 5-10 nm of the vertical depth of any crystal plane of the molecular sieve crystal grains measured by an EMPA method. Also provided are a cracking auxiliary agent or a cracking catalyst containing the phosphorus-modified MFI-structured molecular sieve, as well as a preparation method therefor and an application thereof.
机译:提供了一种磷改性的MFI结构分子筛。 分子筛的K值满足70%≤k≤90%,例如75%≤k90%,此外,例如78%≤k≤85%,其中k = p1 / p2×100 %,P1表示100平方纳米面积内的磷的质量含量和通过XPS方法测量的分子筛晶粒的任何晶体平面的0-2nm的垂直深度,P2表示磷的质量含量 面积为100平方纳米的厚度间隔,垂直深度的垂直深度的分子筛晶粒的垂直深度通过EMPA方法测量。 还提供了裂化助剂或含有磷改性的MFI结构分子筛的裂化催化剂,以及其制备方法及其制备方法及其应用。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号