Neural network-based physical state evaluation of electronic devices, and related systems and methods

摘要

Systems and methods for evaluating the physical and/or appearance state of an electronic device using machine learning techniques are disclosed. In one exemplary aspect, the exemplary system includes a kiosk, wherein the kiosk includes an inspection plate configured to hold an electronic device, one arranged over the inspection plate configured to direct one or more light beams towards the electronic device. one or more light sources, and one or more cameras configured to capture at least one image of the first face of the electronic device. The system also includes one or more processors in communication with one or more cameras configured to extract a set of features of the electronic device and to determine, via the first neural network, a state of the electronic device based on the set of features.