A method and an illumination and detection apparatus for correcting a reflection image and/or fluorescence image in microscopy, in particular in the scanning method of laser microscopy, comprising the following steps: a) radiating a light distribution Io into an excitation path of a microscope using an illumination unit assigned to the microscope, wherein the excitation path guides the light distribution Io to a sample and the light distribution Io is distorted to form a light distribution IA, Probe upon entry into the sample, in particular as a result of scattering effects; b) reflecting the light distribution IA, Probe at the sample into a detection path of the microscope, wherein the IA, Probe is distorted to form the light distribution ID, Probe upon emergence from the sample; c) recording the reflected light distribution ID, Probe; d) transferring the reflected light distribution ID, Probe to a mathematical model F which describes the light propagation in reflection microscopy; e) outputting a 2-tuple (MA, MD), where MA describes the distortion of the light distribution Io upon entry into the sample and where M_D describes the distortion of the light distribution IA, Probe upon emergence from the sample; f) setting a complementary distortion pattern MA# on an optical modulator of the excitation path and a complementary distortion pattern MD# on a further optical modulator of the detection path.
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