Method and illumination and detection device for correcting a reflection image and / or fluorescence image in microscopy, in particular in laser microscopy using the raster method, comprising the following steps: a) irradiating a light distribution I0 with an illumination unit assigned to a microscope into an excitation path of the microscope; wherein the excitation path guides the light distribution I0 onto a sample and the light distribution I0 upon entry into the sample, in particular through scattering effects, is distorted to a light distribution IA, sample; b) reflecting the light distribution IA, sample on the sample into a detection path of the microscope, the IA , Sample on exiting the sample to the light distribution ID, sample is distorted; c) recording the reflected light distribution ID, sample; d) transfer of the reflected light distribution ID, sample to a mathematical model F, which describes the light propagation in reflection microscopy; e) output a 2-tuple (MA, MD), where MAd describes the distortion of the light distribution I0 when entering the sample and where MD describes the distortion of the light distribution IA, sample when exiting the sample; f) setting a complementary distortion pattern MA # on an optical modulator of the excitation path and a complementary distortion pattern MD # on another optical M modulator of the detection path.
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