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Inspection system, learning device, learning program, learning method, inspection device, inspection program, inspection method

机译:检查系统,学习设备,学习计划,学习方法,检测装置,检测程序,检查方法

摘要

PROBLEM TO BE SOLVED: To improve the accuracy of inspecting an inspection target. An inspection system 1 detects an inspection target by using a learning device 100 that learns a detector for detecting a detection target portion of a tank 2 to be inspected and a detector learned by the learning device 100. It is provided with an inspection device 200 for detecting a target site. The learning device 100 includes a learning image acquisition unit that acquires a captured image of an inspection target including a detection target portion, and an image processing unit that performs image processing on the captured image before generating learning data from the captured image of the inspection target. It is provided with a learning data generation unit that generates learning data from the processed image of the detection target portion, and a learning unit that learns the detector using the generated learning data. The inspection device 200 includes an inspection image acquisition unit that acquires a captured image of an inspection target, and a detection unit that detects a detection target portion from the captured image acquired by the inspection image acquisition unit using a detector. [Selection diagram] Fig. 1
机译:要解决的问题:提高检查检查目标的准确性。检查系统1通过使用学习设备100检测检查目标,该学习设备100学习用于检测要检查的罐2的检测目标部分的检测器,并且由学习设备100学习的检测器。它设置有检查装置200用于检测目标网站。学习设备100包括学习图像获取单元,该学习图像获取单元获取包括检测目标部分的检查目标的捕获图像,以及在从检查目标的捕获图像生成学习数据之前对捕获图像执行图像处理的图像处理单元。它提供了一种学习数据生成单元,其从检测目标部分的处理后的图像生成学习数据,以及使用生成的学习数据学习检测器的学习单元。检查装置200包括检查图像获取单元,其获取检查目标的捕获图像,以及检测从由检测器获取的捕获图像检测检测目标部分的检测单元。 [选择图]图1

著录项

  • 公开/公告号JP2021148720A

    专利类型

  • 公开/公告日2021-09-27

    原文格式PDF

  • 申请/专利权人 株式会社LIXIL;

    申请/专利号JP20200051136

  • 发明设计人 梅田 学;

    申请日2020-03-23

  • 分类号G01N21/88;G06T7;

  • 国家 JP

  • 入库时间 2022-08-24 21:16:54

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