METHOD, APPARATUS AND ELECTRONIC DEVICE FOR TEXTING MEMORY, COMPUTER-READABLE STORAGE MEDIUM, AND PROGRAM

摘要

Methods, apparatuses and electronic devices for testing a memory of a chip are disclosed and the present disclosure also is related to the field of chip. Specifically, the chip includes a plurality of operation modules, the operation module includes at least one operation unit, and the operation unit includes at least one memory. The method includes generating a first test vector for a first operation module of the operation modules, and testing the memory in the first operation module by using the generated first test vector independent of other operation modules of plurality of operation modules, where the other operation modules are different from the first operation module. Embodiments of the present disclosure may provide a scheme that efficiently and flexibly tests the memory of a chip.