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State monitoring device, state monitoring system and state monitoring method

机译:状态监测设备,状态监测系统和国家监测方法

摘要

PROBLEM TO BE SOLVED: To provide a state monitoring device that can calculate an evaluation value for highly accurately judging presence or absence of abnormality of an object.SOLUTION: A data processing device 80 comprises: a peak detection unit 103 that detects a peak from a frequency spectrum; and a map generation unit 104 that generates an abnormality map with respect to the frequency spectrum. The abnormality map includes a frequency of the detected object peak and a frequency of a peak appearing together with an object peak supposing that the peak object is a peak arising from abnormality as an abnormality component. The data processing device 80 comprises: an abnormality peak extraction unit 105 that extracts a peak of a frequency coinciding with any of the abnormality components included in the abnormality map as an abnormality peak; and a first evaluation value calculation unit 106 that calculates a first evaluation value indicative of an occurence level of the abnormality corresponding to the abnormality map on the basis of spectrum density of the abnormality peak.SELECTED DRAWING: Figure 2
机译:要解决的问题:提供一种状态监视设备,其可以计算评估值,以便高度准确地判断对象的异常的存在或不存在。概率:数据处理设备80包括:峰值检测单元103,其检测来自a的峰值频谱;和地图生成单元104,其产生相对于频谱的异常图。异常图包括检测到的物体峰值的频率和与假设峰值对象的对象峰值一起出现的峰值的频率是从异常作为异常分量引起的峰值。数据处理设备80包括:异常峰提取单元105,其提取与异常图中包括的异常分量重合的频率的峰值作为异常峰值;和第一评估值计算单元106,其基于异常峰值的频谱密度计算与异常图对应的异常映射的发生水平的第一评估值。选择的绘图:图2

著录项

  • 公开/公告号JP6934832B2

    专利类型

  • 公开/公告日2021-09-15

    原文格式PDF

  • 申请/专利权人 NTN株式会社;

    申请/专利号JP20180064000

  • 发明设计人 畠山 航;

    申请日2018-03-29

  • 分类号G01M99;

  • 国家 JP

  • 入库时间 2022-08-24 21:02:55

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