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MEMORY SYSTEM HAVING COMBINED HIGH DENSITY LOW BANDWIDTH AND LOW DENSITY HIGH BANDWIDTH MEMORIES

机译:内存系统具有组合高密度低带宽和低密度高带宽存储器

摘要

In one embodiment, the memory system may include at least two types of DRAM that differ in at least one characteristic. For example, one DRAM type may be a high density DRAM, while the other DRAM type may have a lower density than the first DRAM type, but may also have lower latency and higher bandwidth. The first type of DRAM may be on one or more first integrated circuits and the second type of DRAM may be on one or more second integrated circuits. In one embodiment, the first and second integrated circuits may be coupled together in a stack. The second integrated circuit may include a physical layer circuit for coupling to other circuitry (eg, an integrated circuit having a memory controller such as a system on a chip (SOC)), the physical layer circuitry being the DRAM in the first integrated circuit can be shared by
机译:在一个实施例中,存储器系统可以包括至少两种类型的DRAM,其在至少一个特征中不同。例如,一个DRAM类型可以是高密度DRAM,而另一个DRAM类型可以具有比第一DRAM类型更低的密度,但也可以具有更低的延迟和更高的带宽。第一类型的DRAM可以位于一个或多个第一集成电路上,并且第二种DRAM可以位于一个或多个第二集成电路上。在一个实施例中,第一和第二集成电路可以在堆叠中耦合在一起。第二集成电路可以包括用于耦合到其他电路的物理层电路(例如,集成电路具有诸如芯片(SOC)上的存储器诸如系统的存储器控​​制器),物理层电路是第一集成电路中的DRAM可以分享

著录项

  • 公开/公告号KR20210083406A

    专利类型

  • 公开/公告日2021-07-06

    原文格式PDF

  • 申请/专利权人 애플 인크.;

    申请/专利号KR20217020299

  • 申请日2017-03-06

  • 分类号G11C5/04;G11C5/06;

  • 国家 KR

  • 入库时间 2022-08-24 20:05:23

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