CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION

摘要

The invention relates to a method for characterizing a sample, by estimating a plurality of characteristic thicknesses, each being associated with a calibration material, comprising the following steps:;acquiring an energy spectrum (S^ech) transmitted through this sample, located in an X and/or gamma spectral band, naled spectrum transmitted through the sample;;for each spectrum of a plurality of calibration spectra (S^base(L_k; L_l)), calculating a likelihood from said calibration spectrum (S^base(L_k; L_l)), and from the spectrum transmitted through the sample (S^ech), each calibration spectrum (S^base(L_k; L_l)) corresponding to the energy spectrum transmitted through a stack of gauge blocks, each formed of a known thickness of a calibration material;;estimating the characteristic thicknesses (L₁, L₂) associated with the sample according to the criterion of maximum likelihood.