首页> 外国专利> CHARGED PARTICLE BEAM SYSTEM, METHOD FOR DETERMINING RANGE FOR AUTOMATICALLY SEARCHING FOR FOCAL POINT POSITION IN CHARGED PARTICLE BEAM DEVICE, AND NON-TRANSITORY STORAGE MEDIUM RECORDING PROGRAM FOR CAUSING COMPUTER SYSTEM TO DETERMINE RANGE FOR AUTOMATICALLY SEARCHING FOR FOCAL POSITION IN CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM SYSTEM, METHOD FOR DETERMINING RANGE FOR AUTOMATICALLY SEARCHING FOR FOCAL POINT POSITION IN CHARGED PARTICLE BEAM DEVICE, AND NON-TRANSITORY STORAGE MEDIUM RECORDING PROGRAM FOR CAUSING COMPUTER SYSTEM TO DETERMINE RANGE FOR AUTOMATICALLY SEARCHING FOR FOCAL POSITION IN CHARGED PARTICLE BEAM DEVICE

机译:带电粒子束系统,用于在带电粒子束装置中自动搜索焦点位置的测距范围的方法,以及用于使计算机系统确定用于自动搜索带电粒子束装置中的焦点位置的范围的非暂时性存储介质记录程序

摘要

The present invention provides a technique for reducing the user's man-hours required for setting an automatic in-focus search function of an electron beam when reviewing defects using an electron microscope, and for facilitating the observation of a sample make it a task As a means for solving these problems, the present disclosure provides, in a charged particle beam system, from the width of the focus metric distribution for the focus position acquired in advance under the same conditions, and the difference between the focus positions before and after automatic in-focus position search, We provide a technology that automatically sets an appropriate focus position search width in consideration of convergence precision and operation time.
机译:本发明提供了一种用于减少在使用电子显微镜进行缺陷时设置电子束的自动聚焦搜索功能所需的用户的人员的技术,并且为了促进样本观察使其成为一种手段为了解决这些问题,本公开在充电的粒子束系统中提供了从在相同条件下预先获取的焦点位置的焦点度量分布的宽度,以及自动中的焦点位置之间的焦点位置之间的差异。焦点位置搜索,我们提供了一种技术,以考虑到收敛精度和操作时间,自动设置适当的焦点位置搜索宽度。

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