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Calibration method and measuring method for measuring X-ray CT apparatus, and X-ray CT apparatus for measurement

机译:测量X射线CT装置和测量X射线CT装置的校准方法和测量方法

摘要

Problem to be solved: to accurately measure the boundary surface of the subject to achieve high accuracy of the X-ray CT for measurement.A CT scan is performed in which the spherical type calibration jig 30 is previously contacted with the subject W, and the volume data is generated.To obtain the profile of the surface shape of the subject w in the volume data andThe boundary surface of the spherical type calibration jig 30 is calculated from the center coordinate of the spherical type calibration jigA correction value is obtained for matching the boundary surface of the object W obtained from the inclination of the profile to the boundary surface of the spherical type calibration jigThe boundary surface of the subject W is obtained using the correction valueThe shape of the object W is determined using the boundary plane.Diagram
机译:要解决的问题:准确测量受试者的边界表面,以实现X射线CT的高精度进行测量。执行CT扫描,其中前面与对象W接触球形校准夹具30,并且产生体积数据。在体积数据和球形边界表面中获得对象W的表面形状的轮廓。型校准夹具30由球形校准jiga校正值的中心坐标计算用于匹配从轮廓的倾斜度的对象W的边界表面匹配到球形校准夹具的边界表面的边界表面使用边界平面确定对象W的校正valse形状获得主题W.diagram

著录项

  • 公开/公告号JP2021050937A

    专利类型

  • 公开/公告日2021-04-01

    原文格式PDF

  • 申请/专利权人 株式会社ミツトヨ;

    申请/专利号JP20190172253

  • 发明设计人 浅野 秀光;今 正人;

    申请日2019-09-20

  • 分类号G01N23/046;

  • 国家 JP

  • 入库时间 2022-08-24 18:02:50

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