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Method for temperature measurements of surfaces with a low, unknown and/or variable emissivity

机译:具有低,未知和/或可变发射率的表面温度测量方法

摘要

Devices and corresponding methods can be provided to monitor or measure temperature of a target or to control a process. Targets can have low, unknown, or variable emissivity. Devices and corresponding methods can be used to measure temperatures of thin film, partially transparent, or opaque targets, as well as targets not filling a sensor's field of view. Temperature measurements can be made independent of emissivity of a target surface by, for example, inserting a target between a thermopile sensor and a background surface maintained at substantially the same temperature as the thermopile sensor. In embodiment devices and methods, a sensor temperature can be controlled to match a target temperature by minimizing or zeroing a net heat flux at the sensor, as derived from a sensor output signal. Alternatively, a target temperature can be controlled to minimize the heat flux.
机译:可以提供设备和相应的方法来监测或测量目标的温度或控制过程。目标可以具有低,未知或可变的发射率。装置和相应的方法可用于测量薄膜,部分透明或不透明目标的温度,以及未填充传感器视野的目标。温度测量可以通过例如在热电孔传感器和作为热电传感器基本相同温度的背景表面之间插入靶表面的靶表面的发射率而与目标表面的发射率无关。在实施例的装置和方法中,可以通过从传感器输出信号中最小化或归零传感器的净热通量来控制传感器温度以匹配目标温度。或者,可以控制目标温度以使热通量最小化。

著录项

  • 公开/公告号US10955295B2

    专利类型

  • 公开/公告日2021-03-23

    原文格式PDF

  • 申请/专利权人 EXERGEN CORPORATION;

    申请/专利号US201815969959

  • 发明设计人 JASON N. JARBOE;FRANCESCO POMPEI;

    申请日2018-05-03

  • 分类号G01J5/06;G01J5;G01J5/12;G01J5/16;

  • 国家 US

  • 入库时间 2022-08-24 17:50:50

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