首页> 外国专利> Method and apparatus for determining particle characteristics utilizing a plurality of beam splitting functions and correction of scattered light

Method and apparatus for determining particle characteristics utilizing a plurality of beam splitting functions and correction of scattered light

机译:用于确定利用多个波束分裂功能的粒子特性和散射光的校正的方法和装置

摘要

Apparatus and methods for determining information about at least one particle by measuring light scattered from the particles. Scattered light is combined with light from a light source to produce an optical interference signal utilizing a plurality of beam splitting functions. Scattered light signals are corrected for signal components which are not derived from particle scatter.
机译:通过测量从颗粒散射的光来确定关于至少一个颗粒的信息的装置和方法。散射光与来自光源的光混合,以产生利用多个波束分离功能的光学干扰信号。散射光信号校正不导出颗粒散射的信号分量。

著录项

  • 公开/公告号US10955327B2

    专利类型

  • 公开/公告日2021-03-23

    原文格式PDF

  • 申请/专利权人 MICHAEL TRAINER;

    申请/专利号US201916507949

  • 发明设计人 MICHAEL TRAINER;

    申请日2019-07-10

  • 分类号G01N15/02;G01N15/14;G01N21/53;G01N21/47;

  • 国家 US

  • 入库时间 2022-08-24 17:50:50

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号