MACHINE-LEARNING DRIVEN PREDICTION IN INTEGRATED CIRCUIT DESIGN

摘要

Training data is collected for each training integrated circuit (IC) design of a set of training IC designs by: extracting a first set of IC design features in a first stage of an IC design flow, and extracting a first set of IC design labels in a second stage of the IC design flow, where the first stage of the IC design flow occurs earlier than the second stage of the IC design flow in the IC design flow. Next, a machine learning model is trained based on the training data.