A Multi-Position Investigating Type of an X-ray Apparatus and a Method for Investigating a Product with the Same

摘要

The present invention relates to an X-ray inspection apparatus and a method of a multi-point inspection method. The x-ray inspection apparatus includes a first guide path 12 connected to the outside of the inspection room R to guide the article A to the first inspection position; At least one first inspection module disposed at a first inspection position formed in the first guide path 12 to perform inspection on at least one inspection point of the article (B); At least one inspection connection path (16a, 16b) for guiding the inspected article (B) to the second inspection position in the first guiding path (12); At least one second inspection module disposed at a second inspection position formed in the inspection connection paths 16a and 16b to perform inspection on at least one other inspection point of the article B; And a second guide path 15 connecting the second test location and the outside of the test room R.