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Method for closing an access opening to a cavity and a MEMS component with a closing element

机译:用于将进入腔的接入开口的方法和具有闭合元件的MEMS部件

摘要

Method (100) for closing an access opening (230) to a cavity (220), comprising the following steps: providing (120) a layer arrangement (221) with a first layer structure (210) and a cavity arranged adjacent to the first layer structure (210) (220), wherein the first layer structure (210) has an access opening (230) to the cavity (220), performing (140) a CVD layer deposition to form a first cover layer (240) with a layer thickness (D240) on the first layer structure (210) with the access opening (230), the layer thickness (D240) of the first covering layer (240) being selected in relation to a diameter (D230) of the access opening (230) in order to create a taper (240-A) of the first covering layer ( 240) in a central area of the access opening (230), and performing (160) an HDP layer deposition with a first and second substep of forming a second cover layer (250) on the first cover layer (240), with a liner material layer (250) being deposited on the first cover layer (240) in the first substep, with partial sputtering of the liner material layer (250) and also the first cover layer (240) in the second substep ) takes place in the area (230-A) of the access opening (230), and the first and second substeps being carried out alternately and repeatedly.
机译:用于将进入开口(230)封闭到腔(220)的方法(100),包括以下步骤:提供(120)具有第一层结构(210)的层布置(221),以及与第一层布置的腔体层结构(210)(220),其中第一层结构(210)具有到腔(220)的接入口(230),执行(140)CVD层沉积以形成第一覆盖层(240)第一层结构(210)上的层厚度(D240)与接入口(230),第一覆盖层(240)的层厚度(D240)相对于接入开口的直径(D230)( 230)为了在接入开口(230)的中心区域中形成第一覆盖层(240)的锥形(240-a),并用第一和第二成形,执行(160)HDP层沉积第一覆盖层(240)上的第二覆盖层(250),衬里材料层(250)沉积在第一覆盖层(240)上RST子步骤,衬里材料层(250)的部分溅射,并且在第二个子步骤中的第一覆盖层(240))发生在接入开口(230)的区域(230a)中,以及第一和第二个子步骤交替地和反复进行。

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