首页> 外国专利> NOVEL LIGHT-ASSISTED QUARTZ CRYSTAL MICROBALANCE AND MEASUREMENT METHOD THEREOF

NOVEL LIGHT-ASSISTED QUARTZ CRYSTAL MICROBALANCE AND MEASUREMENT METHOD THEREOF

机译:新型光辅助石英晶体微稳态及其测量方法

摘要

A novel light-assisted quartz crystal microbalance and a measurement method thereof. The microbalance comprises a QCM/QCM-D chip, an oscillation circuit, a frequency counter, a computer, a reaction chamber, and a light source. Light emitted from the light source is able to irradiate a surface of the QCM/QCM-D chip. By additionally configuring a light source with the ability to irradiate a chip surface, when irradiated the surface of the QCM/QCM-D chip changes properties thereof, and irradiation of the surface of the QCM/QCM-D chip greatly increases the resonance frequency. Correspondingly, irradiation of the surface of the chip also changes mechanical properties and piezioelectric characteristics of quartz crystal, thereby effectively improving measurement sensitivity of a quartz crystal microbalance apparatus system.
机译:一种新型光辅助石英晶体微稳积和其测量方法。微稳定包括QCM / QCM-D芯片,振荡电路,频率计数器,计算机,反应室和光源。从光源发出的光能够照射QCM / QCM-D芯片的表面。通过另外配置具有照射芯片表面的能力的光源,当照射QCM / QCM-D芯片的表面时,QCM / QCM-D芯片的表面的照射大大增加了谐振频率。相应地,芯片表面照射还改变了石英晶体的机械性能和压电电特性,从而有效提高了石英晶体微稳态设备系统的测量灵敏度。

著录项

  • 公开/公告号US2021072188A1

    专利类型

  • 公开/公告日2021-03-11

    原文格式PDF

  • 申请/专利权人 JIANGSU UNIVERSITY;

    申请/专利号US201716763231

  • 发明设计人 JIE WANG;LEI LIU;MINGDONG DONG;

    申请日2017-12-13

  • 分类号G01N29/02;G01N29/22;G01N29/036;

  • 国家 US

  • 入库时间 2022-08-24 17:38:37

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