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Memory controller improving data reliability, Memory system having the same and Operating method of Memory controller

机译:内存控制器提高数据可靠性,存储器系统具有相同和操作方法的存储器控​​制器

摘要

Disclosed are a memory controller with improved data reliability, a memory system including the same, and a method of operating the memory controller. A memory controller according to an aspect of the technical idea of the present disclosure includes a first parity and a second error detection operation used for a first error detection operation on the read data together with data read from a first row of a memory device. A defect determination circuit configured to receive a second parity used for and determine whether the first row is defective based on a result of the first error detection operation and the second error detection operation, and the first row and at least one For a recovery unit including second rows, a parity storage circuit for storing a recovery parity for recovering a defect in a row unit, and when it is determined that the first row is a defective row, at least one second of the recovery unit And a recovery circuit for recovering a defect of the first row by using data of a row and the recovery parity.
机译:公开了一种具有改进的数据可靠性的存储器控​​制器,包括相同的存储器系统,以及操作存储器控制器的方法。根据本公开的技术概念的一个方面的存储器控​​制器包括第一奇偶校验和第二错误检测操作,用于与从存储器设备的第一行读取的数据一起读取的读取数据的第一错误检测操作。缺陷确定电路,被配置为接收用于和确定第一行是否基于第一错误检测操作和第二错误检测操作的结果的第二奇偶校验,以及用于恢复单元的第一行和至少一个第二行,用于存储恢复奇偶校验的奇偶校验存储电路,用于恢复行单元中的缺陷,并且当确定第一行是有缺陷的行时,恢复单元的至少一个第二用于恢复a的恢复电路使用行的数据和恢复奇偶校验来缺陷第一行。

著录项

  • 公开/公告号KR20210023585A

    专利类型

  • 公开/公告日2021-03-04

    原文格式PDF

  • 申请/专利权人 삼성전자주식회사;

    申请/专利号KR1020190103985

  • 发明设计人 이정호;조영진;이승원;

    申请日2019-08-23

  • 分类号G06F11/10;G06F12/0804;G06F3/06;

  • 国家 KR

  • 入库时间 2022-08-24 17:31:53

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