首页> 外国专利> METHOD FOR FABRICATING AND SEMICONDUCTOR DEVICE HAVING THE SECOND BIT LINE CONTACT HIGHER THAN THE TOP SURFACE OF THE FIRST BIT LINE

METHOD FOR FABRICATING AND SEMICONDUCTOR DEVICE HAVING THE SECOND BIT LINE CONTACT HIGHER THAN THE TOP SURFACE OF THE FIRST BIT LINE

机译:制造和半导体器件的制造方法,其具有高于第一位线的顶表面的第二位线接触的方法

摘要

The present application discloses a semiconductor device and a method for fabricating the semiconductor device. The semiconductor device includes a substrate having an upper surface; a plurality of first bit line contacts contacting the upper surface of the substrate; a plurality of first bit lines respectively correspondingly positioned on the plurality of first bit line contacts; a plurality of second bit line contacts contacting the upper surface of the substrate; and a plurality of second bit lines respectively correspondingly positioned on the plurality of first bit line contacts. In some embodiments, the top surfaces of the plurality of second bit line contacts are positioned at a vertical level higher than the top surfaces of the plurality of first bit lines.
机译:本申请公开了一种半导体器件和制造半导体器件的方法。半导体器件包括具有上表面的基板;多个第一位线触点接触基板的上表面;多个第一位线分别相应地定位在多个第一位线触点上;多个第二位线接触接触基板的上表面;并且分别对应于多个第一位线触点上的多个第二位线。在一些实施例中,多个第二位线触点的顶表面位于高于多个第一位线的顶表面的垂直电平。

著录项

  • 公开/公告号US2021066308A1

    专利类型

  • 公开/公告日2021-03-04

    原文格式PDF

  • 申请/专利权人 NANYA TECHNOLOGY CORPORATION;

    申请/专利号US201916552209

  • 发明设计人 CHIH-WEI HUANG;

    申请日2019-08-27

  • 分类号H01L27/108;H01L23/528;H01L23/532;

  • 国家 US

  • 入库时间 2022-08-24 17:29:40

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