首页> 外国专利> Handling malfunction in a memory system comprising a nonvolatile memory by monitoring bad-block patterns

Handling malfunction in a memory system comprising a nonvolatile memory by monitoring bad-block patterns

机译:通过监控坏块模式,处理包括非易失性存储器的存储器系统中的故障

摘要

A controller includes an interface and storage circuitry. The interface communicates with one or more memory devices, each of the memory devices includes multiple memory cells organized in memory blocks. The storage circuitry is configured to perform multiple storage operations to the memory cells in the one or more memory devices, and mark memory blocks in which one or more storage operations have failed as bad blocks. The controller is further configured to identify a pattern of multiple bad blocks occurring over a sequence of multiple consecutive storage operations, the pattern is indicative of a system-level malfunction in a memory system including the controller, and in response to identifying the pattern, to perform a corrective action to the memory system.
机译:控制器包括接口和存储电路。接口与一个或多个存储器设备通信,每个存储器设备包括在存储块中组织的多个存储器单元。存储电路被配置为在一个或多个存储器设备中的存储器单元中对存储器单元执行多个存储操作,并标记其中一个或多个存储操作的存储块失败为坏块。控制器还被配置为识别在多个连续存储操作的序列上发生的多个坏块的模式,该模式指示包括控制器的存储器系统中的系统级故障,并且响应于识别模式。对存储系统执行纠正措施。

著录项

  • 公开/公告号US10936456B1

    专利类型

  • 公开/公告日2021-03-02

    原文格式PDF

  • 申请/专利权人 APPLE INC.;

    申请/专利号US201916280090

  • 申请日2019-02-20

  • 分类号G06F11;G06F11/20;G06F11/14;

  • 国家 US

  • 入库时间 2024-06-14 21:20:28

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