method for elektronenoptischen investigation of kristallgemischen, taking advantage of the kristallgemisch, electron diffraction

• 1. 同时测定对克里西丁磺酸工业品中对克里西丁磺酸和对克里西丁的含量的液相色谱法 [P] . 中国专利： CN1238718C . 2006.01.25
• 2. 基于旋转波片法的斯托克斯偏振仪误差标定和补偿方法 [P] . 中国专利： CN104535192B . 2016.09.14
• 3. Electron beam roehre for the investigation of irradiated objects (electrons diffraction roehre or electron microscope) [P] . 德国专利： DE725847C . 1942-10-01

  机译： 用于研究被辐照物体的电子束线（电子衍射线或电子显微镜）

• 4. device for elektronenoptischen investigation of objektoberflaechen [P] . 德国专利： DE000001439723A . 1969-03-20

  机译： 物镜电子显微镜检查装置

• 5. device for elektronenoptischen investigation of surfaces [P] . 瑞士专利： CH409167A . 1966-03-15

  机译： 表面电子显微镜检查设备

• 1. Hybrid investigation of microelectronical assemblies using X-ray diffraction and other methods [C] . F. KraUse, Th. Voges, F. Rehme, Conference on Applied Crystallography . 1995
• 2. Performance advantages of maximum likelihood methods in PRBS-modulated time-of-flight electron energy loss spectroscopy. [D] . Yang, Zhongyu. 2003
• 3. Raman Spectroscopy X-ray Diffraction and Scanning Electron Microscopy as Noninvasive Methods for Microstructural Alterations in Psoriatic Nails [O] . Anca E. Chiriac, Doina Azoicai, Adina Coroaba, 2021
• 4. I. Modifications of the radial distribution method of interpretation of electron diffraction photographs of gas molecules. II. The electron diffraction investigation of the structure of benzene, pyridine, pyrazine, butadine, cyclopentadiene, furan, pyrrole, and theophene [O] . Schomaker Verner 1938
• 5. INVESTIGATIONS OF ATOMIC PHENOMENA OCCURRING ON OR NEAR THE SURFACE OF SOLIDS BY METHODS OF ULTRA HIGH VACUUM ELECTRON DIFFRACTION AND ELECTRON MICROSCOPY [R] . Benjamin M. Siegel 1966

• 1. Electron Spin Resonance(ESR)Spectroscopy of the Transition-metal Complexes and Clusters I.Systematic Investigations of Real-and Complex-Orbital Methods for Calculating the d-Orbital Energies of a Low-spin(S=1/2)nd^5(t_2~5,~2T_2)(n=3 [J] . ZHAO Kun (Fujian Institute of Research on the Structure of Matter the Chinese Academy of Sciences Fuzhou Fujian China 350002) . 结构化学 . 1999,第2期
• 2. The Method of Testing for Asbestos in Electronic and Electric Products through Polarizing Microscope and X-Ray Diffraction [J] . Hongwei Wang ,Jun Liu ,Qiang Ma . 电力能源（英文） . 2019,第11期
• 3. Determination of Space Group Pncm of Prehnite Using Electron Diffraction Method [J] . 赵文俞 . 武汉理工大学学报：材料科学英文版 . 2002,第4期
• 4. Towards a Methodology for Formal Design and Analysis of Agent Interaction Protocols ——An Investigation in Electronic Commerce [J] . Wei Jun 12 Cheung Shing Chi 1 Wang Xu 1 1. Department of Computer Science Hong Kong University of Science and Technology Clear Water Bay Kowloon Hong Kong China ,2. Institute of Software Chinese Academy of Science Beijing 100080 Ch . 武汉大学自然科学学报：英文版 . 2001,第Z1期
• 5. Effect of Electron Beam Orientation on Exit Wave Function via Simulation of Electron Dynamic Diffraction [J] . Yanguo WANG ,Hongrong LIU ,Canying CAI . 材料科学技术：英文版 . 2007,第5期
• 6. 理性疏忽:内涵、模型及其对经济分析的意义——2011年诺贝尔经济学奖得主克里斯托夫·西姆斯学术贡献评介 [C] . 王军 . 中华外国经济学说研究会第19次学术年会 . 2011
• 7. 克里斯托弗·尼曼插画中的视觉语言研究 [A] . 李豫陇 . 2020