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Improvements relating to apparatus for the testing of optical systems

机译:与光学系统测试设备有关的改进

摘要

826,004. Optical apparatus. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. Jan. 17, 1956 [Jan. 17, 1955], No. 1381/55. Class 97(1) Apparatus for inspecting optical systems comprises means for producing two beams of light plane polarized at right angles and projecting said beams into a system to be tested in such a manner that one of the beams is distributed over the whole surface or cross-section of the system and the other beam is focused on to a small area of the cross-section of the system, and means for combining the two beams emerging from the system to produce an interference fringe pattern, the arrangement being such that irregularities of the system under test cause distortion of the fringe system. Fig. 1 shows. an arrangement for testing a concave spherical mirror 7. At the centre of curvature of the mirror 7 is placed a triplet lens 3, 4, 5 and a lens 10, the central lens 4 of the triplet being birefringent with its optic axis in the plane of the lens, the triplet having zero power for the extraordinary beam but being converging for the ordinary beam. A beam of light 1 plane polarized at 45 degrees to the optic axis of the birefringent lens is divided into two beams of equal intensity. The extraordinary beam is focused by the lens 10 at the pole 8 of the mirror and is returned to the lenses as an ordinary beam after double passage through a greater wave plate 9 and is therefore focused by the lenses at a point 11. The ordinary beam is focused by the lenses at a point 6 thence it diverges to cover the whole mirror 7 and to be returned thereby as an extraordinary beam after double passage through the photo 9 to be also focused at the point 11. An analyser is placed in the combined beams at point 11 to enable interference to take place or the reflector 2 may be multilayer to act as as analyser. Fig. 5 shows a second system for testing a concave spherical mirror 9. A narrower collimated beam 1 is divided by a polarizing reflector into a plane-polarized reflected beam incident at 17 on the mirror 9 and a transmitted beam polarized at right-angles thereto and focused by a lens 7 at the centre of curvature 8 of the mirror after reflection at reflectors 4, 5, 6. The beam focused at 8 diverges to reach the whole aperture of the mirror, is reflected back thereby to the point 8 and then focused by the lens 7 at a point 11 at which the beam reflected at point 17 is also focused, an analyser 12 being provided in the combined beams. The device may also be used to test a positive or negative lens, a suitable mirror being provided to return the light through the system.
机译:826,004。光学仪器。 1956年1月17日[美国联合电气工业有限公司。 1955年1月17日],第1381/55号。用于检查光学系统的97(1)类设备包括产生两束以直角偏振的光束并将其投射到要测试的系统中的装置,以使其中一个光束分布在整个表面或交叉面上。该系统的横截面和另一束光聚焦在该系统横截面的一小部分上,以及用于组合从该系统发出的两束光以产生干涉条纹图案的装置,该布置使得被测系统会导致边缘系统变形。图1所示。用于测试凹面球面镜7的装置。在反射镜7的曲率中心放置一个三重透镜3、4、5和一个透镜10,该三重透镜的中心透镜4在其光轴在平面中是双折射的。对于透镜,三重透镜对非常规光束具有零屈光度,但对普通光束会聚。与双折射透镜的光轴成45度偏振的1平面光束被分成强度相等的两个光束。异常光束被透镜10聚焦在反射镜的极点8处,并在两次通过更大的波片9之后作为常规光束返回到透镜,因此被透镜聚焦在点11处。通过透镜聚焦在点6,然后它发散以覆盖整个反射镜7,并在两次通过照片9之后以特殊光束的形式返回,从而也聚焦在点11。在点11处的光束可以发生干涉,或者反射器2可以是多层的以用作分析器。图5示出了用于测试凹面球面镜9的第二系统。较窄的准直光束1被偏振反射器分成入射在反射镜9上的平面偏振反射光束和17成直角偏振的透射光束。在反射镜4、5、6反射后,由透镜7聚焦在反射镜的曲率中心8处。聚焦在8处的光束发散,到达反射镜的整个孔径,被反射回点8,然后由透镜7聚焦在点11处,在该点处在点17处反射的光束也被聚焦,在组合光束中设置有分析仪12。该设备还可以用于测试正透镜或负透镜,并提供合适的反射镜以使光返回通过系统。

著录项

  • 公开/公告号GB826004A

    专利类型

  • 公开/公告日1959-12-23

    原文格式PDF

  • 申请/专利权人 ASSOCIATED ELECTRICAL INDUSTRIES LIMITED;

    申请/专利号GB19550001381

  • 发明设计人 DYSON JAMES;

    申请日1955-01-17

  • 分类号G01B9/02;

  • 国家 GB

  • 入库时间 2022-08-23 19:06:08

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