method of chemical analysis for measuring the absorption of radiation scattered by compton effect and mechanism of application

摘要

1286588 X-ray analysis COMMISSARIAT A L'ENERGIE ATOMIQUE 24 March 1970 [28 March 1969] 14301/70 Heading G1A In an apparatus for the chemical analysis of a specimen 5 monoenergetic X or γ-radiation from a source 1 is Compton scattered by a scattering material 2 and the absorbing power of the specimen as a function of the wavelengths generated in the scattering process is measured by a detector 4. The source 1 is either a radio-active source or a wide spectrum X-ray tube followed by an X-ray collimator or a crystal selecting the desired wavelength. The wavelength scanning is obtained by rotating either the detector/specimen arrangement or the source about the point of incidence of the beam on the scatterer 2, which itself is rotated at half this angular speed. A diaphragm 3 limits the beam after its passage through the specimen. The source is chosen so that at one point of the scanning, the specimen receives a wavelength equivalent to its K- absorption energy and its absorption at two energies, one on each side of the K-absorption edge, is measured. There may be more than one detector/specimen combination, and to provide a wide range of scattered wavelengths there may be a plurality of scatterers.