首页> 外国专利> TEST CIRCUIT FOR MEASURING FIGURE OF MERIT OR ATTENUATION RATIO OF VIBRATING SYSTEMS

TEST CIRCUIT FOR MEASURING FIGURE OF MERIT OR ATTENUATION RATIO OF VIBRATING SYSTEMS

机译:测量振动系统的品质因数或衰减比的测试电路

摘要

A test circuit for measuring the attenuation ratio of vibrating systems comprises a vibrating system connected to an amplifier in turn connected to a detector responding to average value, and a peak detector connected in parallel to the average detector. The outputs of the two detectors are connected to an adder whose output is applied, through a voltage-to-frequency converter, to a pulse circuit whose outputs are connected to an exciting circuit, to the amplifier and to an integrator.
机译:一种用于测量振动系统的衰减率的测试电路,包括:振动系统,其连接至放大器,所述放大器又连接至响应于平均值的检测器;以及峰值检测器,其并联连接至所述平均检测器。这两个检测器的输出连接到加法器,该加法器的输出通过电压-频率转换器施加到脉冲电路,该脉冲电路的输出连接到激励电路,放大器和积分器。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号