BIT/External Test Figures of Merit and Demonstration Techniques

摘要

Current maintainability parameters and corresponding analysis/demonstration techniques lack the capability of expressing the adequacy of Built-in-Test and/or External Test Equipment (BIT/ETE). Figures of Merit (FOMs) have been identified and defined that can be used to express the adequacy of BIT/ETE. Methodologies have been developed to analyze and demonstrate the defined BIT/ETE FOMs. A methodology has been developed to methodically select the BIT/ETE FOMs required in system/equipment specifications based on the desired system/equipment objectives and requirements. (Author)