首页> 外国专利> Purification of solid epitaxial deposition sources - by dissolution in metal melt and resolidification on melt surface

Purification of solid epitaxial deposition sources - by dissolution in metal melt and resolidification on melt surface

机译:固体外延沉积源的纯化-通过溶解在金属熔体中并在熔体表面重新固化

摘要

Solid source of a material (pref. AIIBV cpd.) ofr epitaxial deposition from the gas phase is purified by placing it in the lower part of a refractory vessel horizontally partitioned with a glass frit diaphragm (pref. quartz glass) and introducing into the upper part of the vessel a solvent for AIIIBV, liquid at the operating temp. (pref. 800 degrees C), which has a greater s.g. than AIIIBV (pref. molten AIII is used as a solvent). the solvent penetrates through the diaphragm into the lower part of the vessel; AIIIBV dissolves in it and diffuses upwards ultimately forming a solid layer of pure AIIIBV on the surface of the molten AIII, which constitutes a pure source for gas-phase epitaxial deposition as most of the impurities remain in the molten AIII. The operation is carried out under pure H2. the pref. AIIIBV cpds. are GaAs and GaP (solvent Ga), InP or InSb (solvent In).
机译:通过将气相外延沉积的材料(优选AIIBV cpd。)的固体源放置在与玻璃料隔板(优选石英玻璃)水平分隔的耐火容器的下部,并将其引入上部,从而进行纯化容器的一部分为AIIIBV的溶剂,在工作温度下为液体。 (首选800摄氏度),具有更大的s.g.比AIIIBV(将熔融的AIII用作溶剂)。溶剂通过隔膜渗透到容器的下部; AIIIBV在其中溶解并向上扩散,最终在熔融AIII的表面上形成纯AIIIBV的固体层,由于大部分杂质保留在熔融AIII中,因此构成了气相外延沉积的纯净来源。该操作在纯氢气下进行。偏好。 AIIIBV cpds。是GaAs和GaP(溶剂Ga),InP或InSb(溶剂In)。

著录项

  • 公开/公告号DE2247976A1

    专利类型

  • 公开/公告日1974-04-11

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE19722247976

  • 发明设计人 GISDAKISSPYRIDONDIPL.-PHYS.;

    申请日1972-09-29

  • 分类号B01J17/06;

  • 国家 DE

  • 入库时间 2022-08-23 05:25:52

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号