首页> 外国专利> METHOD AND APPARATUS FOR SURFACE DEFECT DETECTION USING DETECTION OF NON-SYMMETRICAL PATTERNS OF NON-SPECULARLY REFLECTED LIGHT

METHOD AND APPARATUS FOR SURFACE DEFECT DETECTION USING DETECTION OF NON-SYMMETRICAL PATTERNS OF NON-SPECULARLY REFLECTED LIGHT

机译:利用非对称反射光的非对称图形检测表面缺陷的方法和装置

摘要

A cylindrical metal object to be inspected for surface defects is rotated about its axis and a collimated laser beam is axially scanned across the object surface in a plane normal to the surface. A plurality of photoelectric detectors are symmetrically arranged on each side of the scanning plant to detect light non-specularly reflected from the object. Defects causing an unsymmetrical reflection to the detectors are sensed by summing the outputs of symmetrically disposed pairs of detectors and comparing the summed outputs to determine significant differences in the summed outputs and producing a defect signal when such differences occur.
机译:将要检查表面缺陷的圆柱形金属物体绕其轴旋转,并在垂直于该表面的平面上轴向扫描准直的激光束,横过物体表面。多个光电检测器对称地布置在扫描设备的每一侧上,以检测从物体非镜面反射的光。通过对对称放置的检测器对的输出求和,并对求和的输出进行比较以确定求和的输出中的显着差异,并在出现这种差异时产生缺陷信号,可以检测到导致对检测器反射不对称的缺陷。

著录项

  • 公开/公告号US3834822A

    专利类型

  • 公开/公告日1974-09-10

    原文格式PDF

  • 申请/专利权人 GENERAL MOTORS CORPUS;

    申请/专利号US19730345959

  • 发明设计人 STAPLETON TUS;FARRAR RUS;

    申请日1973-03-29

  • 分类号G01N21/16;G01N21/48;

  • 国家 US

  • 入库时间 2022-08-23 04:54:45

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号