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process of reaction of single crystal silicon doping phosphorus is uniform by irradiation with neutrons

机译:中子辐照使单晶硅掺杂磷的反应过程均匀

摘要

Monocrystalline phosphorus doped silicon is prepd. by neutron irradiation of the monocrystalline silicon without subsequent annealing or aging to remove or compensate for the damage to the crystal network due to the irradiation, by a process in which a polycrystalline Si body is first formed by vapour deposition, then converted to a monocrystal and the conductivity is measured and on the bases of this measurement the neutron irradiation required at a given temp. to obtain the desired phosphorus concn. is calculated, then the polycrystalline Si is irradiated according to the values of the functions indicated. Uniform doping is obtd, without use of heat treatment appts.
机译:准备单晶掺磷硅。通过中子辐照单晶硅而无需随后的退火或时效处理以消除或补偿由于辐照而对晶体网络造成的损害,其方法是先通过汽相淀积形成多晶硅体,然后将其转化为单晶并测量电导率,并在此测量的基础上测量给定温度下所需的中子辐照。获得所需的磷浓度。计算出Si的含量,然后根据所示函数的值辐照多晶硅。无需使用热处理装置即可进行均匀掺杂。

著录项

  • 公开/公告号BE841352A

    专利类型

  • 公开/公告日1976-08-16

    原文格式PDF

  • 申请/专利权人

    申请/专利号BE19760166632

  • 发明设计人

    申请日1976-04-30

  • 分类号B01J;

  • 国家 BE

  • 入库时间 2022-08-23 02:59:04

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