the device дл  измерени  of сопротивлени  высокоомных semiconductor materials and the life time of the free current carriers

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  机译： 在用作主电流路径的第一部分和器件的其余部分之间具有不同载流子寿命的半导体开关器件

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  机译： 在用作主电流路径的第一部分和器件的其余部分之间具有不同载流子寿命的半导体开关器件

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  机译： 测量高阻半导体材料的比电阻和电荷载体寿命的装置

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