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INTERFEROMETRIC OBSERVATION OF SMALL DISPLACEMENTS

机译:小位移的干涉测量

摘要

1422180 Interferometry COMPAGNIE GENERALE D'ELECTRICITE 21 June 1973 [10 April 1973] 29625/73 Addition to 1339348 Heading G2J A method of interferometric observation of a small displacement of an optical object comprises (a) positioning a source of mono-chromatic coherent light; (b) positioning a beam-splitter to divide the initial beam into first and second beams; (c) placing first and second diffusing material objects so that when they are illuminated by beams respectively they produce first and second diffused beams to form first and second optical objects which are identical and appear to be illuminated by beams 8, 7 at the same angle of incidence; (d) positioning means for superposing the diffused beams so that the optical objects appear to be exactly superposed; (e) applying a small displacement to one of the two optical objects; (f) producing the initial beam and in turn the illuminating, diffused and superposed beams; (g) disposing in the path of the superposed beams a convergent optical system incorporating an astigmatic element so as to pro- vide a minimum focal distance in a plane containing the axis of the superposed beams and a maximum focal distance in another plane containing the same axis, means being provided for adjusting one of the focal distances and (h) adjusting the adjusting means to obtain interference fringes from the superposed beams. In one arrangement Fig. 1 one optical object is a material object 1 while the other is produced by a hologram 2. Both are illuminated by a laser 3 via a beam-splitter 6. The optical system 13 contains a convergent lens 13, two cylindrical lenses 15, 16 and a screen 12. In use, lenses 15, 16 are selected by trial and error from a set of varying powers until clear fringes appear on the screen 12. Alternatively, each lens 15, 16 may be replaced by a set of cylindrical lenses of the same fixed direction but of adjustable spacing to adjust the power of the set. In a modification of this arrangement Fig. 7, (not shown) lenses 15, 16 are replaced by a single cylindrical lens 38 which is mounted so as to be adjustably rotatable about the optical axis 11 as also shown in Fig. 8. Again, lens 38 may be selected from a set or be replaced by a set of parallel similar lenses. In another arrangement (Fig. 8) both optical objects are material objects 1, 820 illuminated by a laser 3. In setting up, objects 1, 820 are in identical states and orientations so that no fringes can be seen. The displacement to be observed is then applied to object 1 and lens 38 is adjusted until clear fringes are seen. Information is given on the interpretation of the observed fringe systems.
机译:1422180干涉测量公司1973年6月21日[1973年4月10日] 29625/73标题G2J的补充。一种干涉测量光学物体小位移的方法,包括:(a)定位单色相干光源; (b)放置分束器以将初始光束分成第一和第二光束; (c)放置第一和第二散射材料物体,使得当它们分别被光束照射时,它们产生第一和第二散射光束以形成相同的第一光学物体和第二光学物体,并且看起来以相同的角度被光束8、7照射发生率(d)定位装置,用于叠加散射光束,从而使光学物体看起来正好叠加; (e)对两个光学物体之一施加较小的位移; (f)产生初始光束,然后产生照明光束,散射光束和重叠光束; (g)在叠加光束的路径上放置一个装有像散元件的会聚光学系统,以便在包含叠加光束轴的平面上提供最小焦距,并在另一个包含该光束的平面上提供最大焦距。轴,提供用于调节焦距之一的装置,(h)调节调节装置以从叠加光束中获得干涉条纹。在图1的一种布置中,一个光学对象是一个实物对象1,另一个是由全息图2产生的。二者均由激光3经由分束器6照射。光学系统13包含一个会聚透镜13,两个圆柱体透镜15、16和屏幕12。在使用中,通过反复试验从一组不同的光焦度中选择透镜15、16,直到在屏幕12上出现清晰的条纹为止。或者,每个透镜15、16可以由一组透镜来代替。固定方向相同但间距可调的圆柱透镜,以调节该镜组的光焦度。在图7的这种配置的变型中,透镜15、16(未示出)由单个柱面透镜38代替,该柱面透镜38被安装成可围绕光轴11可调节地旋转,如图8所示。透镜38可以选自一组,也可以由一组平行的类似透镜代替。在另一种布置中(图8),两个光学物体都是被激光3照射的实物物体1,820。在设置时,物体1,820处于相同的状态和取向,因此看不到条纹。然后将要观察的位移施加到物体1上,并调整镜头38,直到看到清晰的条纹为止。给出了有关观察到的条纹系统的解释的信息。

著录项

  • 公开/公告号GB1422180A

    专利类型

  • 公开/公告日1976-01-21

    原文格式PDF

  • 申请/专利权人 COMPAGNIE GENERALE DELECTRICITE;

    申请/专利号GB19730029625

  • 发明设计人

    申请日1973-06-21

  • 分类号G01B9/02;G01B9/021;

  • 国家 GB

  • 入库时间 2022-08-23 01:44:50

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