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Articulated probe for three dimensional displacement measurement - is controlled by position motors and has two dimensional position transducer

机译:用于三维位移测量的铰接式探头-由位置电机控制,并具有二维位置传感器

摘要

The articulated probe is for three dimensional displacement inspection and measurement, especially for control surface inspection, in which the probe head is controlled independently in two dimensions over small excursions by independent control circuits so that no spring energy is stored. The probe head (1) is mounted on a two axis bearing arrangement, with independent position control motors (5, 6) and a two dimensional position transducer consisting of a light beam (9) and photodiode detector array (7). The whole arrangement is mounted in a fork shaped mount (2) on the head of the inspection machine. The probe (1) tip (10) can thus move independently in two axes under the control of the two circuits. The electrical stepping motors has a defined null position in its connection with the pick-up.
机译:铰接式探头用于三维位移检查和测量,特别是用于控制表面检查,其中探头头由独立的控制电路在较小的偏移范围内二维独立地控制,因此不会存储弹簧能量。探头(1)安装在带有独立位置控制电机(5、6)和由光束(9)和光电二极管检测器阵列(7)组成的二维位置传感器的两轴轴承装置上。整个装置安装在检查机头上的叉形底座(2)中。因此,探针(1)尖端(10)可以在两个回路的控制下在两个轴上独立移动。步进电机在与传感器之间的连接中具有定义的零位。

著录项

  • 公开/公告号DE2718465A1

    专利类型

  • 公开/公告日1978-11-02

    原文格式PDF

  • 申请/专利权人 FROHNEHEINRICHPROF.DR.-ING.;

    申请/专利号DE19772718465

  • 发明设计人 FROHNEHEINRICHPROF.DR.-ING.;

    申请日1977-04-26

  • 分类号G01B;

  • 国家 DE

  • 入库时间 2022-08-22 21:57:27

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