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Study of luminescent materials by electron beam microscope - involves spectroscope with slit adjustable in height and width

机译:用电子束显微镜研究发光材料-包括具有可调节高度和宽度的狭缝的光谱仪

摘要

Luminescent materials are studied by the observation of the light emitted when they are excited by an electron beam. A spectroscope is inserted between the sample and the photomultiplier tube and is operated to obtain optimum quality of image for the wavebands of interest. A sample (E) is set at an angle such that the telescope (10) receives the maximum energy from the source. A cylindrical light beam of reduced cross section is obtained at the output doublet (13). This beam is directed onto a dispersive glass prism (21) with minimum deviation for the sodium D radiation and then onto an achromatic condenser (31, 32). A slit (41) with adjustable level and opening selects the spectral region and intensity for the photomultiplier (PM).
机译:发光材料是通过观察电子束激发时发出的光来研究的。将光谱仪插入样品和光电倍增管之间,并进行操作以获得感兴趣波段的最佳图像质量。将样品(E)设置为一定角度,以使望远镜(10)从源接收最大能量。在输出双重透镜(13)处获得横截面减小的圆柱光束。将该光束以钠D辐射的最小偏差射入色散玻璃棱镜(21),然后射入消色差聚光镜(31、32)。水平和开口可调的狭缝(41)为光电倍增管(PM)选择光谱区域和强度。

著录项

  • 公开/公告号FR2245937B1

    专利类型

  • 公开/公告日1979-03-23

    原文格式PDF

  • 申请/专利权人 BEAUVINEAU JACKY;

    申请/专利号FR19730035044

  • 发明设计人

    申请日1973-10-01

  • 分类号G01J3/02;G01N23/00;

  • 国家 FR

  • 入库时间 2022-08-22 19:39:38

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