首页> 外国专利> ELECTRON-BEAM TUBE INCLUDING A THERMIONIC-FIELD EMISSION CATHODE FOR A SCANNING ELECTRON MICROSCOPE

ELECTRON-BEAM TUBE INCLUDING A THERMIONIC-FIELD EMISSION CATHODE FOR A SCANNING ELECTRON MICROSCOPE

机译:包含用于扫描电子显微镜的热场发射阴极的电子束管

摘要

An electron-beam tube for a scanning electron microscope employs the use of a TF built-up field emission cathode which can be operated from preferably the 100 plane in a substantially continuous mode to provide a stable electron beam having high current density, high resolution, and very high electron optical brightness from a source of very small proportions. The tube, which comprises an evacuated envelope having chambers of different vacuums, is designed to facilitate either quick-change cathode replacement or attendance to the specimen with minimum loss of operating time since the vacuum of the entire tube need not be released. Also, the chamber containing the field emission cathode can be separable from the tube to allow replacement by a new preprocessed cathode in a pre-evacuated chamber. In this case, the mounting means includes a device for puncturing a seal in the cathode chamber to allow the electron beam to pass therethrough.
机译:用于扫描电子显微镜的电子束管使用TF组合场发射阴极,该阴极可从100平面以基本上连续的模式进行操作,以提供具有高电流密度,高分辨率的稳定电子束,以及来自很小比例光源的非常高的电子光学亮度。该管包括一个具有真空度不同的腔室的抽空外壳,其设计目的是便于快速更换阴极或照管标本,同时减少了操作时间,因为不需要释放整个管的真空度。而且,包含场致发射阴极的腔室可与管分离,以允许在预先排空的腔室中被新的预处理阴极替代。在这种情况下,安装装置包括用于刺穿阴极室中的密封件以允许电子束通过的装置。

著录项

  • 公开/公告号JPS5661960U

    专利类型

  • 公开/公告日1981-05-26

    原文格式PDF

  • 申请/专利权人

    申请/专利号JP19800138035U

  • 发明设计人

    申请日1980-09-26

  • 分类号H01J37/06;

  • 国家 JP

  • 入库时间 2022-08-22 16:35:55

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