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Integrated circuit with internal semiconductor supply switch - allowing internal gates to be tested even when circuit is operating
Integrated circuit with internal semiconductor supply switch - allowing internal gates to be tested even when circuit is operating
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机译:带有内部半导体电源开关的集成电路-即使在电路运行时也可以测试内部门
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摘要
The integrated circuit has its individual circuit elements, such as logic gates, testable even when the IC is connected to other ICs in a complete circuit, i.e. in a composite LSI chip. This is particularly useful in complex ICs. The IC's internal logic gates are connected to one supply voltage rail and, over an internal semiconductor switch (T1) to the other supply rail (Us). The switch's control electrode is connected to an external terminal to which a switching signal (SH) is applied to disconnect the supply from the gates. In normal operating conditions the supply voltage is switched through.
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