首页> 外国专利> QUANTITATIVE ANALYSIS METHOD OF CR2O3 IN SAMPLE CONSISTING ESSENTIALLY OF ZNO BY FLUORESCENT X-RAY METHOD

QUANTITATIVE ANALYSIS METHOD OF CR2O3 IN SAMPLE CONSISTING ESSENTIALLY OF ZNO BY FLUORESCENT X-RAY METHOD

机译:X射线荧光法定量测定基本上为ZNO的样品中CR2O3的方法。

摘要

PURPOSE:To analyze Cr2O3 in a voltage non-linear resistor consisting essentially of ZnO in particular quantitatively and quickly with high accuracy by polishing a sample with #180 carborundum then washing the same, and drying it with hot wind thence analyzing the Cr2O3 quantitatively by a fluorescent X-ray method. CONSTITUTION:A sample consisting essentially of ZnO is polished with #180 carborundum, after which it is washed and is dried with hot wind; thereafter the Cr2O3 in the sample is determined by a fluorescent X-ray method. Particularly the voltage non-linear resistance element is added with necessary Cr2O3, Bi2O3, Co2O3, MnO2, Sb2O3, NiO, SiO2, etc. other than the essential component ZnO but Cr2O3 is determined quickly with high accuracy by the above- described analytical method without the influence of the contents of such other components. Since the sample is analyzed non-destructively with the simple pre- treatment, the results thereof are used quickly for controlling product quality.
机译:目的:要在基本上由ZnO组成的电压非线性电阻器中,特别是定量和快速地分析Cr2O3,方法是用#180的金刚砂抛光样品,然后洗涤并用热风干燥,然后用原子吸收光谱法定量分析Cr2O3。荧光X射线法。组成:基本上由ZnO组成的样品用#180金刚砂抛光,然后洗涤并用热风干燥。然后通过荧光X射线法测定样品中的Cr2O3。特别地,电压非线性电阻元件除了必需成分ZnO之外还添加了必要的Cr 2 O 3,Bi 2 O 3,Co 2 O 3,MnO 2,Sb 2 O 3,NiO,SiO 2等,但是通过上述分析方法可以快速,高精度地测定Cr 2 O 3。这些其他组件的内容的影响。由于使用简单的预处理即可对样品进行无损分析,因此可将其结果快速用于控制产品质量。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号