首页> 外国专利> APPARATUS AND METHOD FOR NON-CONTACT FOLLOWING AN ELECTRICAL CHARACTERISTIC SUCH AS THE IMPEDANCE OF A SUBSTANCE PRESENT IN A SELECTED SITE OF INVESTIGATION

APPARATUS AND METHOD FOR NON-CONTACT FOLLOWING AN ELECTRICAL CHARACTERISTIC SUCH AS THE IMPEDANCE OF A SUBSTANCE PRESENT IN A SELECTED SITE OF INVESTIGATION

机译:在选定的调查地点中跟随电气特性作为物质存在的阻抗的非接触装置和方法

摘要

THE INVENTION CONCERNS AN APPARATUS AND A METHOD FOR NON-CONTACT FOLLOWING VARIATIONS IN THE IMPEDANCE OF A SUBSTANCE PRESENT IN A DETERMINED AREA OF INVESTIGATION. / P P THIS APPARATUS HAS A BIDIRECTIONAL ANTENNA 12 WHICH PRODUCES AN ELECTROMAGNETIC BEAM COMPRISING TWO FIREPLACES ONE OF WHICH IS LOCATED NEARBY IN THE IMMEDIATE AREA OF THE AREA OF INVESTIGATION. A RECEIVER 14, PLACED NEAR THE OTHER FOCUS, IS CHECKED SO THAT VARIATIONS IN ELECTRICAL CHARACTERISTICS APPEARING IN THIS RECEIVER 14 CAN BE INTERPRETED AS INDICATIONS OF IMPEDANCE VARIATIONS APPEARING IN THE AREA CHOSEN. / P P FIELD OF APPLICATION: MEDICAL DIAGNOSTICS, RESEARCH AND DETECTION OF DEFECTS IN METALLIC PARTS, ETC. / P
机译:本发明涉及一种用于在确定的调查区域中存在的物质的阻抗中的非接触式跟随变化的装置和方法。

该设备具有双向天线12,它产生一个电磁波,该电磁波由两个相似的两个光纤组成,位于附近的调查区域中。检查放置在另一个焦点附近的接收器14,以便可以理解该接收器14中出现的电气特性变化,作为在所选区域中出现的阻抗变化的指示。

应用领域:医学诊断学,金属零件缺陷的研究和检测等。

著录项

  • 公开/公告号FR2487521A1

    专利类型

  • 公开/公告日1982-01-29

    原文格式PDF

  • 申请/专利权人 EMIT INC;EMIT INC;

    申请/专利号FR19800016566

  • 发明设计人 YUKL TEX N;

    申请日1980-07-28

  • 分类号G01N22/00;A61B5/05;G01D5/48;G01R27/06;G01R29/08;

  • 国家 FR

  • 入库时间 2022-08-22 12:28:58

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