Device for detecting the surface unevenness of wire-shaped material

摘要

A device for detecting surface unevenness by the utilization of reflected light of wires having a covering of light-transmissive insulating material such as enamel. Light is projected onto the wire- shaped material and is received therefrom by means of glass fibers. The incident angle of light applied to the insulating material is selected to be larger than the critical angle of the material. A rod lens is provided for each glass fiber in such a manner that the longitudinal axis of the rod lens is orthogonal to the longitudinal axis of the glass fiber. A light shielding board is disposed between the light projection side and the light receiving side so that only light reflected by the surface of the wire-shaped material is received whereby the surface unevenness of the insulating material layer is detected without being affected by scratches or defects on the wire conductor.