首页> 外国专利> Method when measuring the properties of a material by a microwave-frequency measuring procedure to compensate for the influence of random variations in the mutual position of the antennas and the material on the measurement result

Method when measuring the properties of a material by a microwave-frequency measuring procedure to compensate for the influence of random variations in the mutual position of the antennas and the material on the measurement result

机译:通过微波频率测量程序测量材料特性以补偿天线和材料相互位置的随机变化对测量结果的影响的方法

摘要

There is described a method for measuring of properties of a material by using microwave energy, which is directed against the material and detected after its passage through and/or reflection against the material. To compensate for the perturbing influence on the measurement result that can be produced by variations in the position of the material relative to the microwave antennas used, especially when the measurement occurs on a material which can move during the measurement, two separate measurement channels with essentially the same frequency are used, wherein the sending and receiving antennas for these two measurement channels are arranged at somewhat different positions relative to the material in such a way that when the position of the material varies, a signal change occurring in one measurement channel, such as that caused by interference, corresponds to an oppositely directed change in the signal in the other measurement channel, so that a mean value, possibly weighted, of the measurement signals from the two channels will be essentially unaffected by variations in the position of the material relative to the sending and receiving antennas. IMAGE
机译:描述了一种用于通过使用微波能来测量材料的性能的方法,该微波能量被引导朝向该材料并且在其穿过和/或被该材料反射之后被检测。为了补偿由于材料相对于所用微波天线的位置变化而对测量结果造成的干扰影响,尤其是当测量发生在可在测量过程中移动的材料上时,两个独立的测量通道使用相同的频率,其中用于这两个测量通道的发送和接收天线被布置在相对于材料稍微不同的位置,使得当材料的位置发生变化时,信号会在一个测量通道中发生变化,例如由于由干扰引起的变化,对应于另一个测量通道中信号的相反方向变化,因此来自两个通道的测量信号的平均值(可能是加权的)基本上不受材料位置变化的影响相对于发送和接收天线。 <图像>

著录项

  • 公开/公告号SE428503B

    专利类型

  • 公开/公告日1983-07-04

    原文格式PDF

  • 申请/专利权人 INSINOORITOIMISTO INNOTEC OY;

    申请/专利号SE19780008586

  • 发明设计人 S * HEIKKILE;

    申请日1978-08-11

  • 分类号G01N22/00;

  • 国家 SE

  • 入库时间 2022-08-22 10:57:41

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