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METHOD FOR MEASURING DC CHARGING LIFE OF ZNO ELEMENT

机译:Zno元件直流充电寿命的测量方法

摘要

PURPOSE:To enable the concrete calculation of a DC charging life by detecting leakage current from the temp. rising condition of an element and the changing condition in the electrical characteristic of said element and discriminating the life characteristic of the element. CONSTITUTION:DC is charged on a ZnO element and the relation between leak current and charging time is made by utilizing the continuous increase of the leak current generated at said time on account of a change in the electrical characteristic of the element and taking the temp. rise of the element into consideration for the leak current. A current-time curve is drawn by using actually measured heat radiating conditions and performing repetitive operation with a computer, and the time till thermal runaway is calculated. The leak current is thus detected from the temp. rising condition of the element and the changing condition in the electrical characteristic of the element and the life characteristic of the element is discriminated from the result of the measurement when the current values attains a prescribed value or above, whereby the DC charging life is concretely calculated.
机译:目的:通过检测温度泄漏电流来具体计算直流充电寿命。元件的上升状态和所述元件的电特性的变化状态,并判别该元件的寿命。组成:在ZnO元件上给DC充电,并且由于元件的电气特性发生变化并采用温度,利用在该时间产生的泄漏电流的连续增加来建立泄漏电流与充电时间之间的关系。元件的上升考虑到泄漏电流。通过使用实际测量的散热条件并通过计算机执行重复操作来绘制电流-时间曲线,并计算直至热失控的时间。因此,从温度检测泄漏电流。当电流值达到规定值或以上时,从测量结果中区分出元件的上升状态和元件的电特性的变化状况以及元件的寿命特性,从而具体地计算出直流充电寿命。

著录项

  • 公开/公告号JPS59116059A

    专利类型

  • 公开/公告日1984-07-04

    原文格式PDF

  • 申请/专利权人 MEIDENSHA KK;

    申请/专利号JP19820232885

  • 发明设计人 WATANABE MISUZU;HIRANO SHINJI;

    申请日1982-12-22

  • 分类号H01C7/12;G01R31/00;

  • 国家 JP

  • 入库时间 2022-08-22 09:41:14

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