首页> 外国专利> HOLOGRAM SHEARING INTERFEROMETER FOR MEASURING LATERAL ABBERATION OF LENS

HOLOGRAM SHEARING INTERFEROMETER FOR MEASURING LATERAL ABBERATION OF LENS

机译:测量镜头横向像差的全息剪切干涉仪

摘要

PURPOSE:To facilitate observation eliminating any complicated operation and calculation by letting a shearing interference fringe plotting an abberation curve directly utilizing lateral deviation in the interference fringe caused by tilting. CONSTITUTION:A first hologram H1 performs a double-exposure recording of an interference fringe between parallel lights fH2 and fH(2+DELTA) and a reference light fH1 illuminated through a collimator lens L6. A second hologram H2 performs a double-exposure recording of an interference fringe between light fH2 reproduced by an illumination light to the hologram H1 from the direction of the light fH1 and a reference light fH3 and an interference fringe between the light fH(2+DELTA) and the other reference light fH(3+DELTA) obtained by turning the light fH3 about a parallel in the direction of shearing it. A lens LT to be inspected is placed at the position of the lens L6 and the hologram H2 is illuminated through the lens LT and then, done by the reproduced light from the hologram H1 whereby an interference fringe formed by the reproduced light from the hologram H2 is observed.
机译:目的:为便于观察,消除了任何复杂的操作和计算,方法是让剪切干涉条纹直接利用倾斜引起的干涉条纹中的横向偏差绘制出偏差曲线。组成:第一全息图H1对平行光fH2和fH(2 + DELTA)与通过准直透镜L6照射的参考光fH1之间的干涉条纹进行两次曝光记录。第二全息图H2对由照明光从光fH1和参考光fH3的方向再现到全息图H1的光fH2和参考光fH3之间的干涉条纹以及光fH(2 + DELTA)之间的干涉条纹进行两次曝光记录。 )和另一条参考光fH(3 + DELTA),它是通过沿平行于剪切方向的平行方向旋转光fH3而获得的。将待检查的透镜LT放置在透镜L6的位置处,并且通过透镜LT照射全息图H2,然后通过来自全息图H1的再现光来完成,从而由来自全息图H2的再现光形成的干涉条纹。被观察到。

著录项

  • 公开/公告号JPS6067834A

    专利类型

  • 公开/公告日1985-04-18

    原文格式PDF

  • 申请/专利权人 KOGYO GIJUTSUIN (JAPAN);

    申请/专利号JP19830175713

  • 发明设计人 MATSUDA JIYOUJI;

    申请日1983-09-22

  • 分类号G01B9/021;G01B11/24;G01M11/02;G03H1/00;

  • 国家 JP

  • 入库时间 2022-08-22 08:27:10

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