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Method for classifying the quality of a product to be tested on a test stand

机译:在试验台上对待测产品质量进行分类的方法

摘要

Data which are simple to measure (current, voltage, speed of rotation) are to be used for classifying products to be tested as "good" or "faulty" and with respect to their individual quality features. In this connection, the products classified as faulty should receive a note regarding type, location and possibly magnitude of the fault. The classification method should not permit any uncertainties about the quality features determined. For this purpose, m measurable features of the product to be tested are recorded which are related to a total of n parameters (P1 to P6) via mathematical equations describing various functions of the product. The parameters are variable in dependence on the quality features of the product to be tested and are calculated on fault-free products and on products with predetermined faults and are input into a memory. The values of the n parameters (P1 to P6) of the fault-free products (diagram 1) are allocated to a class of good products and those of the products with predetermined faults (diagram II) are allocated to classes of faulty products and sequentially stored in the memory. The values of the n parameters of a product to be classified passing through the test stand are calculated by a computer by means of the m features measured in the test stand, using the mathematical equations, and compared with the stored sequences. When the calculated sequence corresponds to a stored sequence ... Original abstract incomplete. IMAGE
机译:易于测量的数据(电流,电压,旋转速度)将用于将要测试的产品根据其各自的质量特征分类为“好”或“有缺陷”。在这方面,分类为有缺陷的产品应收到有关缺陷的类型,位置以及可能的严重程度的注释。分类方法不应允许对确定的质量特征有任何不确定性。为此,通过描述产品各种功能的数学方程式,记录了待测产品的m个可测量特征,这些特征与总共n个参数(P1至P6)有关。这些参数根据要测试的产品的质量特征而变化,并在无故障产品和具有预定故障的产品上计算得出,并输入到存储器中。将无故障产品(图1)的n个参数(P1至P6)的值分配给一类好产品,将具有预定故障的产品(图II)的n个参数的值依次分配给有故障的产品类存储在内存中。通过计算机,使用数学方程式,通过计算机在测试台上测量的m个特征,计算出通过测试台的待分类产品的n个参数的值,并将其与存储的序列进行比较。当计算出的序列与存储的序列相对应时。原始摘要不完整。 <图像>

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