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PREVENTIVE CIRCUIT FOR MALFUNCTION DUE TO LEAK CURRENT

机译:泄漏电流导致的故障预防电路

摘要

PURPOSE:To prevent the malfunction of a circuit due to a leak current, by connecting a semiconductor element of the same side as transistor Tr generating a leak current, between the connectin point between the leak-current generating Tr and the next- stage Tr, and a power supply. CONSTITUTION:With switch 5 opened, no driving current flows from Tr3 to Tr8, but a leak current is generated at Tr3 and increases as the junction temperature rises. However, the same leak current as that at the base-open time of Tr3 flows to leak processing Tr11 and,in consequence, the leak current of Tr3 will not flow to the base of Tr8, so that the malfunction caused by the leak current can be prevented. Specially as for a semiconductor integrated circuit, Trs of the same size are formed on the same pellet and the leak currents of Tr3 and Tr11 therefore vary in the same direction, so that the malfunction due to the leak current can be prevented under no influence of element dispersion, temperature variation, etc.
机译:目的:为防止由于泄漏电流引起的电路故障,在泄漏电流产生Tr与下一级Tr之间的连接点之间连接与产生泄漏电流的晶体管Tr相同侧的半导体元件,和电源。组成:在开关5断开的情况下,没有驱动电流从Tr3流向Tr8,但是在Tr3处产生泄漏电流,并随着结温的升高而增加。然而,与Tr3的基极开路时相同的泄漏电流流到泄漏处理Tr11,结果,Tr3的泄漏电流将不会流到Tr8的基极,从而由泄漏电流引起的故障会发生。被预防。特别地,对于半导体集成电路,在相同的小片上形成相同尺寸的Trs,因此Tr3和Tr11的泄漏电流沿相同方向变化,从而可以在不受到任何影响的情况下防止由于泄漏电流引起的故障。元素分散,温度变化等

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