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INVERSION TYPE HIGH ELECTRON MOBILITY TRANSISTOR DEVICE

机译:反转型高电子迁移率晶体管器件

摘要

PURPOSE:To obtain high mobility two-dimensional electrons and make contact resistances of electrodes small and provide high speed characteristics by a method wherein the growth of AlGaAs is temporarily discontinued halfway and a planar doping layer of Si is provided. CONSTITUTION:A nondoped AlGaAs layer is made to grow by the application of molecular beams from the sources of three elements, Al, Ga and As. Then application of Al and Ga is discontinued and Si and As are applied to make growth of the thickness of single-atom layer of Si. This is a process for forming a very thin doping layer of the thickness of the order of the layer of atoms and the layer is called and atomic planar doping layer. Then application of Si is discontinued and AlGaAs is made to grow again and, further, the planar doping player of Si is formed again. Thus, growths of the Si planar doping layers are repeated 3-4 times halfway the growth of the AlGaAs layer to form an electron supply layer 3.
机译:用途:为了获得高迁移率的二维电子,并使电极的接触电阻较小,并提供一种通过以下方法提供高速特性的方法,其中,AlGaAs的生长暂时中途中断,并提供平面的Si掺杂层。组成:通过施加来自三种元素铝,镓和砷的分子束,使非掺杂的铝镓砷层生长。然后,停止施加Al和Ga,并施加Si和As以增加Si的单原子层的厚度。这是用于形成厚度为原子层的数量级的非常薄的掺杂层的过程,该层被称为原子平面掺杂层。然后,停止施加Si,并使AlGaAs再次生长,并且进一步,再次形成Si的平面掺杂剂。因此,Si平面掺杂层的生长在AlGaAs层的生长的一半处重复3-4次,以形成电子供应层3。

著录项

  • 公开/公告号JPS6235677A

    专利类型

  • 公开/公告日1987-02-16

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP19850176194

  • 发明设计人 ISHIKAWA TOMONORI;

    申请日1985-08-09

  • 分类号H01L29/812;H01L21/338;H01L29/36;H01L29/778;

  • 国家 JP

  • 入库时间 2022-08-22 07:26:12

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