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DEVELOPING DEVICE FOR POSITIVE-TYPE RESIST

机译:正型抗蚀剂的开发装置

摘要

PURPOSE:To enable a sufficient amount of developing solution to be utilized, by holding the developing solution inside a gap for holding the developing solution by surface tension between an upper plate and a material processed. CONSTITUTION:A material processed 30 is held on a plate 11 in a holding board, with resist 20 positioned above. Then, an upper plate 40 is lowered to approximate to the material processed 30 and narrow a developing solution holding gap h. Then, the developing solution 50 is held inside the gap h by surface tension between the upper plate 40 and the resist 20 when the developing solution is dipped from a nozzle 60 so that the developing solution 50 is supplied into the gap h and the upper plate 40 is moved upward little by little to widen the gap h. Thus, a sufficient amount of developing solution 50 can be utilized to perform the developing of the resist 20. Therefore, time required for the developing can be shortened.
机译:目的:通过将显影液保持在间隙中,以便利用上板和被处理材料之间的表面张力将显影液保持在间隙中,从而能够使用足够量的显影液。组成:经过处理的材料30被固定在固定板上的板11上,抗蚀剂20位于上方。然后,降低上板40以使其接近所处理的材料30,并缩小显影液保持间隙h。然后,当从喷嘴60浸入显影液时,通过上板40和抗蚀剂20之间的表面张力将显影液50保持在间隙h内,从而将显影液50供应到间隙h和上板中。 40一点一点地向上移动以扩大间隙h。因此,可以利用足够量的显影液50来进行抗蚀剂20的显影。因此,可以缩短显影所需的时间。

著录项

  • 公开/公告号JPS62199018A

    专利类型

  • 公开/公告日1987-09-02

    原文格式PDF

  • 申请/专利权人 ROHM CO LTD;

    申请/专利号JP19860042577

  • 发明设计人 MAFUNE FUMIHIKO;SATOU ATSUTOSHI;

    申请日1986-02-26

  • 分类号H01L21/30;G03F7/00;G03F7/30;H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-22 07:25:31

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