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Microscopic detection of membrane surface defects through interference patterns

机译:通过干涉图案微观检测膜表面缺陷

摘要

Transparent membranes are examined with a microscope having coaxial brightfield illumination fitted with a narrow bandwidth filter to convert polychromatic light from a source to substantially monochromatic light. Light reflecting off of the surfaces of the membrane recombine to create an interference pattern, including observable fringes in the region of membrane surface aberrations. Membranes which may be examined include pellicles used to cover photomasks and photo-resist layers. If a photo- resist layer is examined, a filter is selected to provide essentially monochromatic light at a wavelength to which the resist is insensitive.
机译:用具有同轴明场照明的显微镜检查透明膜,该显微镜装有窄带宽滤光片,以将来自光源的多色光转换为基本上单色的光。从膜表面反射回来的光重新结合以形成干涉图案,包括在膜表面像差区域中可观察到的条纹。可以检查的膜包括用于覆盖光掩模和光刻胶层的防护膜。如果检查了光致抗蚀剂层,则选择滤光片以在该抗蚀剂不敏感的波长处提供基本上单色的光。

著录项

  • 公开/公告号US4636078A

    专利类型

  • 公开/公告日1987-01-13

    原文格式PDF

  • 申请/专利权人 MICROMANIPULATOR MICROSCOPE CO. INC.;

    申请/专利号US19830539051

  • 发明设计人 T. CHARLES PODVIN;

    申请日1983-10-04

  • 分类号G01B9/04;G01B9/02;

  • 国家 US

  • 入库时间 2022-08-22 07:09:47

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