首页> 外国专利> DETECTION METHOD FOR FAILED MINOR LOOP OF BUBBLE MEMORY

DETECTION METHOD FOR FAILED MINOR LOOP OF BUBBLE MEMORY

机译:气泡微弱循环的检测方法

摘要

PURPOSE:To detect a failed minor loop in a short time by permitting a magnetic bubble to circle under a condition that a bias magnetic field which is larger than a low limit bias magnetic field in which the magnetic bubble circle within a minor loop and which is smaller than the lower bias magnetic field in an integrated driving area. CONSTITUTION:If the magnetic bubble of test information is written in a minor loop mR which is formed in a magnetic bubble memory element and the low limit bias magnetic field in the total operation area is set to HBL1, and a low limit bias magnetic field in which the magnetic bubble circle the minor loop mR is to HBL2, the magnetic bubble in which writing is executed is permitted to circle in the minor loop mR in bias magnetic fields HBL1-HBL2. Thus, the failed loop which exists near the low limit of the integrated operation area due to a defect existing in the pattern of the minor loop mR and a pattern generation substrate can be detected in a short time.
机译:目的:通过在一定的偏置磁场大于下限偏置磁场的情况下允许磁泡盘旋,从而在短时间内检测出故障的小环,其中下限偏置磁场大于小气泡在小环内盘旋的下限偏置磁场。小于集成驱动区域中的下偏置磁场。组成:如果将测试信息的磁气泡写入形成在磁气泡存储元件中的次循环mR中,并且将整个操作区域中的下限偏置磁场设置为HBL1,则将下限偏置磁场设置为当磁气泡围绕次回路mR到HBL2时,允许执行写入的磁泡在偏置磁场HBL1-HBL2中在次回路mR中盘旋。因此,可以在短时间内检测出由于次要回路mR的图案和图案产生基板中存在的缺陷而存在于综合操作区域的下限附近的故障回路。

著录项

  • 公开/公告号JPS63244388A

    专利类型

  • 公开/公告日1988-10-11

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP19870077281

  • 发明设计人 TANAKA HIROICHI;

    申请日1987-03-30

  • 分类号G11C11/14;G11C19/08;

  • 国家 JP

  • 入库时间 2022-08-22 07:07:59

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