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AUTOMATIC MEASURINGGINSPECTING UNIT

机译:自动测量金探仪

摘要

PURPOSE:To improve efficiency, workability and reliability by semiautomatically measuring and inspecting physical characteristics of the head of VTR at a time. CONSTITUTION:Sample 1 in sample supply carrier 12 is carried to a measurement position under microscope 10 by mechanism part 8 and the track width of sample 1 is expanded and projected upon monitor TV3, which generates electron line 3a on the screen on TV control part 4 movably, through microscope 10 and TV camera 9. When line 3a is positioned at the track width position, control part 4 converts the interval of line 3a into the distance of the image of microspcope 10, which is displayed on panel 5. Inductance, insulating resistance and conduction resistance are measured by measuring instrument 6 with measurement part 13 brought into contact with terminals 1d and 1e of sample 1 and then displayed on panel 5. Microcomputer 14 in box 11 makes a decision between acceptance and rejection as a result of the inspection; and a rejected sample is carried out by mechanism part 8 and accepted one is stored in carrier 15.
机译:目的:通过一次半自动测量和检查VTR磁头的物理特性来提高效率,可操作性和可靠性。组成:样本供应载体12中的样本1被机构部分8运送到显微镜10下的测量位置,样本1的轨迹宽度被扩展并投射到监视器TV3上,从而在TV控制部分4的屏幕上产生电子线3a通过显微镜10和电视摄像机9可移动地移动。当线3a位于轨道宽度位置时,控制部分4将线3a的间隔转换为微sppepepe 10的图像的距离,该距离显示在面板5上。电阻和传导电阻通过测量仪器6进行测量,使测量部件13与样品1的端子1d和1e接触,然后显示在面板5上。方框11中的微计算机14根据检查结果在接受和拒绝之间做出决定。 ;拒收的样品由机构部8取出,接受的样品存储在载体15中。

著录项

  • 公开/公告号JPS633370B2

    专利类型

  • 公开/公告日1988-01-23

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP19790095641

  • 发明设计人 NAKAMURA CHIHIRO;YONEZAWA TAKETOSHI;

    申请日1979-07-26

  • 分类号G01R31/18;G01R31/00;G11B5/455;

  • 国家 JP

  • 入库时间 2022-08-22 07:03:30

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