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MINUTE STRUCTURE OF POLYCRYSTALLINE WSI2 FILM

机译:多晶硅WSI2膜的细微结构

摘要

PURPOSE:To obtain a WSi2 film having low resistance, by orienting crystal grains. CONSTITUTION:After ordinary washing is performing with acid, the surface of a P-type (511) Si substrate 2 is cleaned with dilluted fluoric acid treatment. The substrate 2 is heated in an evaporating apparatus to evaporate W. Thus, a WSi2 film which has the directivity that crystal grains are oriented to the same direction can be formed. In the case of a half-metallic material such as WSi2, scattering of a grain boundary can be made weak by orienting the crystal grains. Therefore, the resistance can be reduced by orienting the crystal grains.
机译:目的:通过取向晶粒来获得具有低电阻的WSi2膜。组成:用酸进行常规洗涤后,用稀释的氟酸处理清洁P型(511)硅衬底2的表面。基板2在蒸发装置中被加热以蒸发W。因此,可以形成具有晶粒朝向相同方向取向的方向的WSi 2膜。在诸如WSi 2的半金属材料的情况下,可以通过使晶粒取向来使晶界的散射弱。因此,可以通过取向晶粒来减小电阻。

著录项

  • 公开/公告号JPS6355961A

    专利类型

  • 公开/公告日1988-03-10

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP19860201054

  • 发明设计人 OKABAYASHI HIDEKAZU;TANIGAWA AKIO;

    申请日1986-08-26

  • 分类号H01B5/14;H01L21/3205;H01L23/52;

  • 国家 JP

  • 入库时间 2022-08-22 07:02:04

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